講演情報
[17a-S4_201-1]Development of a Focused-Ion-Beam Fabricated Diamond Pillar for Scanning Ensemble Nitrogen-Vacancy Magnetometry using an Ultrapure Diamond
〇(P)Dwi Prananto1, Yifei Wang1, Yuta Kainuma2, Kunitaka Hayashi1, Masahiko Tomitori1, Toshu An1 (1.JAIST, 2.AIST)
キーワード：
Diamond NV center、Scanning probe microscopy、Magnetometry
Electron spins at the apex of a scanning diamond nitrogen-vacancy (NV) center probe microscope (SNVM) have proven to be a versatile quantum sensor for studying condensed matter phenomena at the nanoscale, enabled by the spin probe's proximity to the sample[1]. Recently, Ga+-ion-focused-ion-beam (FIB) milling has been introduced as an alternative method for fabricating SNVM[2], with a limitation on the probe diameter to a few µm due to Ga+-induced damage. Here, we present a method to improve the quality of an ultrapure diamond SNVM probe by protecting the surface with polyvinyl alcohol and Pt/Pd capping during FIB fabrication, followed by post-fabrication ultraviolet/Ozone exposure. Using this approach, we successfully fabricated an SNVM tip with a diameter of 800 nm and confirmed the effectiveness of the method through coherence properties measurements. Importantly, the SNVM tip, mounted on a sharpened tungsten rod attached to a laterally oscillating tuning fork-based phase-locked loop (PLL)-regulated AFM system, was demonstrated to image the magnetic domain structure of a ferrimagnetic sample with a resolution of a few hundred nanometers and a sensitivity of 6.7 µT/Hz1/2.
References:
[1] J. Rovny, et al. Nat. Rev. Phys. 6, 753 (2024).
[2] Y. Kainuma, et al. J. Appl. Phys. 130, 243903 (2021).
References:
[1] J. Rovny, et al. Nat. Rev. Phys. 6, 753 (2024).
[2] Y. Kainuma, et al. J. Appl. Phys. 130, 243903 (2021).