講演情報
[18a-M_123-5]X-ray-induced radiation damage of copper(II) phthalocyanine on 1T-TiSe2
〇Hibiki Orio1,2, Maximilian Unzelmann1,2, Christian Metzger1,2, Markus Scholz3, Kai Rossnagel3,4, Friedrich Reinert1,2 (1.Wuerzburg Univ., 2.ctd.qmat, 3.DESY, 4.Kiel Univ.)
キーワード：
photoelectron spectroscopy、organic semiconductor、2D material
Photoelectron spectroscopy is a powerful tool for probing the electronic structure of organic materials. A major concern in such studies is sample degradation under light irradiation. Here, we investigate the electronic structure of CuPc on TiSe2 using angle-resolved photoelectron spectroscopy, with particular emphasis on X-ray–induced degradation. Our results show that the degradation rate depends strongly on the substrate, even for identical molecules, and we discuss the resulting effect on the interfacial electronic properties.