Presentation Information
[P-70]Development of a Defect Identification Method Using the Fusion of Synchronously Acquired NIR and VIS Imaging for Film-Coated Tablets
*Yijing Huang1, Takashi Nishii1 (1. Nippon Shinyaku Co., Ltd. (Japan))
Keywords:
Tablet Coating Defects,YOLO,Automated Defect Inspection,NIR-VIS image fusion,AI