Presentation Information
[H932-2pm-06]High-Throughput Second-Generation Crystalline Sponge Method via Plate-Based Screening
○Hiyu Suga1, Wei He2, Hiroki Takezawa1, Makoto Fujita2,3 (1. School of Eng., The Univ. of Tokyo, 2. Institute for Molecular Science, 3. Tokyo College, The Univ. of Tokyo)
Keywords:
Single crystal X-ray diffraction analysis,Host-guest,Crystalline sponge method,High throughput
