Presentation Information

[R2P-01]Description of diffraction patterns with single-crystal Gandolfi method and correction factors for their intensities

*Satoshi Hayakawa1, Hiroki Okudera2 (1. Kanazawa Univ. Sci. & Eng. (present: Kyoto Univ. Sci), 2. Kanazawa Univ. Sci. & Eng.)

Keywords:

single crystal,X-ray diffraction,Gandolfi camera,diffraction patterns,reciprocal lattice points

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