Presentation Information
[R2P-01]Description of diffraction patterns with single-crystal Gandolfi method and correction factors for their intensities
*Satoshi Hayakawa1, Hiroki Okudera2 (1. Kanazawa Univ. Sci. & Eng. (present: Kyoto Univ. Sci), 2. Kanazawa Univ. Sci. & Eng.)
Keywords:
single crystal,X-ray diffraction,Gandolfi camera,diffraction patterns,reciprocal lattice points
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