Presentation Information

[19p-A202-8]Epitaxial Growth of MoS2 on Al2O3 by Reactive Sputtering

〇(D)Myeongok Kim1,2, Yoshitaka Okada1,2 (1.Eng. UTokyo, 2.RCAST UTokyo)

Keywords:

Reactive sputtering,MoS2,Epitaxial growth

Reactive sputtering is an industry-friendly bottom-up growth method that can control the flux of each precursor. The ability to control each precursor flux is critical for the growth of device quality MoS2. In this research, we investigate the epitaxial growth of multi-layer MoS2 on Al2O3 by reactive sputtering. It is found that reducing the rotational symmetry of the substrate, either by adding step-edges on (0001) c plane or using two-fold symmetry plane, (10-10) M plane, is effective in improving the epitaxial growth of MoS2 with aligned domains, especially under high S/Mo flux ratio condition. It can be assumed that formation energy degeneracy among R0o, R30o, R60o state of MoS2 on c-Al2O3 can be broken by choosing appropriate substrate in reactive sputtering as it has been reported in other bottom-up growth methods. Improved crystallinity can be attributed to seamless stitching of unidirectional domains.