Presentation Information
[21a-A202-8]30-50-nm-thick WSe2 back-channel pFETs with WOx S/D self-aligned to top gate
〇Ryosuke Kajikawa1, Takamasa Kawanago2, Iriya Muneta1, Takuya Hoshii1, Kuniyuki Kakushima1, Kazuo Tsutsui1, Hitoshi Wakabayashi1 (1.Tokyo Inst., 2.FIRST)
Keywords:
WSe2,Self-aligned process