[21a-A304-1~11] 13.5 Semiconductor devices/ Interconnect/ Integration technologies

9:15 AM - 9:30 AM JST(12:15 AM - 12:30 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[21a-A304-2] Bayesian estimation approach for error rate characterization of single electron transport

〇Go Sakamoto¹, Kazuto Takahashi¹, Chihiro Kondo¹, Raisei Mizokuchi¹, Tetsuo Kodera¹, Jun Yoneda¹ (1.Tokyo Tech)

Keywords:

single-electron,charge detection,Bayesian estimation

Single-electron control technology using quantum dots is expected to be applied to various quantum technologies such as quantum computers. For application purposes, it is necessary to improve its accuracy. In this study, we focus on Bayesian estimation, which can reflect the uncertainty of charge detection, to improve the accuracy of error detection in single charge transport using quantum dots. The integration time dependence of the likelihood ratio obtained from the measured data of single charge transport suggests that we may be in a regime where Bayesian estimation is useful for high-speed measurements.