[22a-B202-1~9] 13.2 Exploratory Materials, Physical Properties, Devices

9:15 AM - 9:30 AM JST(12:15 AM - 12:30 AM UTC)

[22a-B202-2] Evaluation of carrier density in Mg₂Si bulk substrate by 4-point probe method

〇Kaito Ojima¹, Tatsuya Uematsu¹, Shunya Sakane¹, Haruhiko Udono¹ (1.Ibaraki Univ.)

Keywords:

4-point probe method