Presentation Information
[22p-B101-13]Current dependence of line profiles of CL intensity in UV-C band AlGaN multiple quantum well structures
〇Yuta Onisi1, Yamaguchi Ryuhei1, Takesue Tosihiro1, Kurai Satosi1, Okada Narihito1, Uesugi Kenjiro2,3, Miyake Hideto4, Yamada Yoichi1 (1.Yamaguchi Univ., 2.ORIP, Mie Univ., 3.Grad. School of RIS, Mie Univ., 4.Grad. School of Eng, Mie Univ.)
Keywords:
AlGaN,Cathodoluminescence,Defect