Presentation Information

[23a-A303-6]Phonon analysis of SiO2 with different atomic densities using ultra-high energy resolution STEM-EELS

〇Takanori Asano1, Manabu Tezura1, Masumi Saitoh1, Hiroki Tanaka1 (1.Kioxia Corp.)

Keywords:

SiO2,STEM-EELS,Phonon