[23p-B202-1~6] 1.5 Instrumentation, measurement and Metrology

2:15 PM - 2:30 PM JST(5:15 AM - 5:30 AM UTC)

[23p-B202-4] High throughput electron microscopic assessment using field-flow fractionation

〇Haruhisa Kato¹, Ayako Nakamura¹, Hidekuni Bannno¹ (1.AIST)

Keywords:

particle characterization,electronic microscope,field-flow fractionation

Electronic microscopic (EM) methods are effective techniques to assess size/size distribution, morphology, surface structure, and aggregation/agglomeration states of various materials; however, these methods have used a high cost on the measurements to get ensemble results for these physico-chemical characteristics. Using field-flow fractionation (FFF) method, low-cost performance problem was solved; thus, the developed FFF-EM method will be presented.