Session Details

[22a-A602-1~9]3.7 Optical measurement, instrumentation, and sensor (formerly 3.8)

Fri. Sep 22, 2023 9:00 AM - 11:30 AM JST
Fri. Sep 22, 2023 12:00 AM - 2:30 AM UTC
A602 (KJ Hall)
Tatsutoshi Shioda(Saitama Univ.), Michiko Nishiyama(Soka Univ.)

[22a-A602-1]Evaluation of Zinc Oxide Nanoparticles by UV Nanoscale Photoluminescence Spectroscopy

〇Takahiro Kondo1, Shunsuke Toya1, Hayato Higashi1, Yuika Saito1 (1.Gakushuin Univ.)

[22a-A602-2]Generation of Terahertz Optical Microwave generation by Optical Frequency Comb Synthesizer/Analyzer and its application to TOF distance measurement

〇(M2)Ryo Uchiyama1, Noso Daisuke1, Tatsutoshi Shioda1 (1.Saitama Univ.)

[22a-A602-3]Development of the optical detection technology of the hydrogen gas

〇Takeshi Tajiri1, Toshihiro Okamoto2, Masanobu Haraguchi2 (1.ITC of Nagasaki Pref., 2.pLED, Tokushima Univ.)

[22a-A602-4]A Study on Graphene Ribbons Covering the Ridges of Guided-Mode Resonant Grating for Enhanced Goos-Hänchen Shift Biosensing

〇Akio Mizutani1, Hirotaka Shimizu1, Hisao Kikuta1 (1.Osaka Metropolitan Univ.)

[22a-A602-5]Distinguishing dielectric materials with nearly identical refractive indices using Spatial Goos-Hänchen shift measurements

〇(M2)Jared Joshua Cabacungan Operana1, Nina Angelica Simon1, Nathaniel Hermosa1 (1.Univ. of the Philippines Diliman)

[22a-A602-6]Crack detection using laser displacement measurement system based on signal intensity correlation

〇Yoshihiro Endo1, Kengo Kumano1, Tamaki Ideno1, Yosuke Tanaka1 (1.Tokyo Univ. A&T)

[22a-A602-7]Measurement of nitride concentration in sewage by mid-infrared ATR method

〇Ren Arai1, Saiko Kino1, Yuji Matsuura1 (1.Tohoku Univ. Eng.)

[22a-A602-8]Wireless passive PT-symmetric LCR circuits-based temperature sensor

〇(D)Priyanka Chaudhary1, Akhilesh Kumar Mishra1 (1.IIT Roorkee India)

[22a-A602-9]Development of a laser inspection scheme for semiconductor chips (Ⅱ)Development of a laser inspection scheme for semiconductor chips (Ⅱ)<o:p></o:p>

〇Reo Terauchi1, Katsuhiro Mikami1, Tetsuya Matsuyama1, Kenichi Ikeda2, Yusuke Nakaminami2, Masanori Otake2 (1.Kindai Univ., 2.Opto Systems Co., LTD)