Session Details

[19a-A37-1~10]3.7 Optical measurement, instrumentation, and sensor

Thu. Sep 19, 2024 9:15 AM - 12:00 PM JST
Thu. Sep 19, 2024 12:15 AM - 3:00 AM UTC
A37 (TOKI MESSE 3F)
Tatsutoshi Shioda(Saitama Univ.), Takashi Kato(UEC)

[19a-A37-1]Observation of laser generated ultrasound with optical interferometer

〇(M2)Sotaro Komatsu1, Hayasaki Yoshio1 (1.Utsunomiya Univ. CORE)

[19a-A37-2]Single-shot spectral phase measurement of mid-infrared pulses with upconversion time-stretch spectroscopy

〇(M2)Zhihao Deng1, Takuro Ideguchi1 (1.The Univ. of Tokyo)

[19a-A37-3]Bandwidth broadening in background noise cancelling method using antiphase pulses of phase-controlled optical frequency comb

〇Keito Hino1, Takashi Kato1, Kaoru Minoshima1 (1.UEC)

[19a-A37-4]Combination of dual-comb spectroscopic polarimetry and single-pixel imaging

〇Shogo Tanimura1, Eiji Hase2, Yu Tokizane2, Takeo Minamikawa2,3, Takeshi Yasui2 (1.Grad. Sch. Sci. Tech. Innov. Sci., Tokushima Univ., 2.pLED, Tokushima Univ, 3.Grad. Sch. Engg. Sci., Osaka Uni)

[19a-A37-5]Study on dual-comb spectroscopy with modulated repetition frequency towards high-speed detection

〇Mayo Ito1, Ruichen Zhu1, Takashi Kato1, Akifumi Asahara1, Kaoru Minoshima1 (1.UEC)

[19a-A37-6]Spectral range expansion of dual-comb spectroscopy based on two types of combs

〇Ken Kashiwagi1, Sho Okubo1, Hajime Inaba1 (1.AIST)

[19a-A37-7]Broadband Dual-comb Cavity-Mode Dispersion Spectroscopy

〇Sho Okubo1, Hajime Inaba1 (1.AIST, NMIJ)

[19a-A37-8]Measurement of multi-component gas spectrum using mechanically shared dual-comb fiber laser

〇Masanori Oto1 (1.Fuji Electric)

[19a-A37-9]Investigation of suppressed residual fluctuation in sensor signal of dual-comb refractive index sensing

〇Masayuki Higaki1, Shogo Miyamura1, Shuji Taue2, Yu Tokizane3, Eiji Hase3, Takeo Minamikawa4,3, Takeshi Yasui3 (1.Grad. Sch. Sci. Tech. Innov. Sci., Tokushima Univ., 2.Koch Univ. Tech., 3.pLED, Tokushima Univ., 4.Grad. Sch. Engg., Osaka Univ.)

[19a-A37-10]Simultaneous measurement of refractive index and geometrical thickness of glass substrate using low-coherence interferometry

〇Hiroki Morita1, Kento Kowa2, Yoshitomo Nakashima2, Hiroyuki Kowa2, Akira Masumura2, Naoji Oya2, Takeshi Higashiguchi1 (1.Utsunomiya Univ., 2.TRIOPTICS)