Presentation Information

[22p-21C-2]Atomic force microscopy and scanning near-field optical microscopy on single quantum-well InGaN blue LEDs

〇(D)Zhaozong Zhang1, Ryota Ishii1, Kanako Shojiki1, Mitsuru Funato1, Daisuke Iida2, Kazuhiro Ohkawa2, Yoichi Kawakami1 (1.Kyoto Univ., 2.KAUST)

Keywords:

scanning near-field optical microscopy,SQW InGaN-based blue LED,threading dislocation