講演情報
[22p-21C-2]Atomic force microscopy and scanning near-field optical microscopy on single quantum-well InGaN blue LEDs
〇(D)Zhaozong Zhang1, Ryota Ishii1, Kanako Shojiki1, Mitsuru Funato1, Daisuke Iida2, Kazuhiro Ohkawa2, Yoichi Kawakami1 (1.Kyoto Univ., 2.KAUST)
キーワード:
scanning near-field optical microscopy、SQW InGaN-based blue LED、threading dislocation