Presentation Information
[22p-P07-49]Characterization of a 2D material–3D metal Interface by Kelvin Probe Force Microscopy
〇Mitsuhiro OKADA1, Yuki Okigawa1, Takahiko Endo2, Wen Hsin Chang1, Naoya Okada1, Yasumitsu Miyata2, Toshitaka Kubo1, Toshifumi Irisawa1, Takatoshi Yamada1 (1.AIST, 2.Tokyo Metropolitan Unv.)
Keywords:
transition metal dichalcogenides,Kelvin probe force microscopy,metal-semiconductor Interface