Presentation Information

[23a-22A-6]Suppression of crack generation in strained SiGe on Ge-on-Si(111) by selective ion implantation

〇Masaki Nagao1, Ayaka Odashima1, Takahiro Inoue1, Michihiro Yamada2,3, Kohei Hamaya2,4, Kentaro Sawano1 (1.Tokyo City Univ., 2.CSRN, Osaka Univ., 3.JST-PRESTO, 4.OTRI, Osaka Univ.)

Keywords:

strained Silicon Germanium,crystal growth,ion implantation