Presentation Information

3:45 PM - 4:00 PM JST(6:45 AM - 7:00 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[23p-12H-9]Development of Integrated Measurement System for Local C-V Mapping and Piezoresponse Force Microscopy

〇(M1)Yuki Noguchi¹, Takanori Mimura², Takao Shimizu², Hiroshi Funakubo², Yoshiomi Hiranaga¹ (1.Tohoku Univ., 2.Tokyo Tech.)

Keywords:

integrated measurement system,ferroelectric

By observing static domain structure and domain dynamics of ferroelectric using Piezoresponse Force Microscopy (PFM) and Scanning Nonlinear Dielectric Microscopy (SNDM) - based local C-V mapping, various information about ferroelectric can be obtained. In this research, we developed integrated measurement system for local C-V mapping and PFM and observed identical ferroelectric by each measurement mode.

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