Session Details
[23p-12H-1~11]6.1 Ferroelectric thin films
Sat. Mar 23, 2024 1:30 PM - 4:30 PM JST
Sat. Mar 23, 2024 4:30 AM - 7:30 AM UTC
Sat. Mar 23, 2024 4:30 AM - 7:30 AM UTC
12H (Building No. 1)
Yoshiomi Hiranaga(Tohoku Univ.), Shinya Yoshida(Shibaura Inst. of Tech.), Hiroshi Uchida(Sophia Univ.)
[23p-12H-1][The 55th Young Scientist Presentation Award Speech] Ferroelectricity of Ce and Mn co-substituted ZnO thin films
〇Rei Ogawa1, Atsuhiro Tamai1, Kiyotaka Tanaka1, Hideaki Adachi1, Isaku Kanno1 (1.Kobe Univ.)
[23p-12H-2]Thickness dependence of Ce and Mn co-substituted ZnO ferroelectric thin films
〇Atsuhiro Tamai1, Rei Ogawa1, Kiyotaka Tanaka1, Hideaki Adachi1, Isaku Kanno1 (1.Kobe Univ.)
[23p-12H-3]Epitaxial growth of Ce,Mn substituted ZnO films by sputtering method
and electrical characterization
〇Moe Sakaguchi1, Norifumi Fujimura1, Takeshi Yoshimura1 (1.Osaka Metro. Univ.)
[23p-12H-4]Growth of MgSiN2 Films and Characterization of Their Properties
〇(M1)Sotaro Kageyama1, Kazuki Okamoto1, Shinnosuke Yasuoka1, Yoshihiro Ueoka2, Masami Mesuda2, Hiroshi Funakubo1 (1.Tokyo Tech., 2.Tosoh Corp.)
[23p-12H-5]Effect of polaronic hopping conduction on dielectric properties in low-crystalline BaTiO3 thin films
〇Shinya Kondo1, Taichi Murakami1, Loick Pichon2, Joel Leblanc-Lavoie2, Teranishi Takashi1, Tomoaki Yamada3, Akira Kishimoto1, My Ali El Khakani2 (1.Okayma Univ., 2.INRS, 3.Nagoya Univ.)
[23p-12H-6]Effects of PBW Processing on Ferroelectric Materials on Substrate Properties
〇Jun Hirade1, Masaki Yamaguchi1,2, Hideo Kimura3 (1.Shibaura Inst. of Tech., 2.IRCGE, Shibaura Inst. of Tech., 3.Yantai Univ.)
[23p-12H-7]Direct Measurement of Electrocaloric Effect of in Ferroelectric Thin Films
〇Jun Usami1, Yuki Okamoto1, Takeshi Kobayashi1, Hiroyuki Yamada1 (1.AIST)
[23p-12H-8]Time-resolved electric field-induced second harmonic generation spectroscopy: Optoelectronic setup for polarization reversal in ferroelectric material
〇(PC)Siddhant Anandrao Dhongade1, Akihito Sawa1, Hiroyuki Yamada1, Hiroyuki Matsuzaki1 (1.National Institute of Advanced Industrial Science and Technology (AIST))
[23p-12H-9]Development of Integrated Measurement System for Local C-V Mapping and Piezoresponse Force Microscopy
〇(M1)Yuki Noguchi1, Takanori Mimura2, Takao Shimizu2, Hiroshi Funakubo2, Yoshiomi Hiranaga1 (1.Tohoku Univ., 2.Tokyo Tech.)
[23p-12H-10]Measurement of Stress Free Electrostrictive Constants and Nonlinear Dielectric Constants of LiNbO3 Single Crysta
〇Yasuo Cho1, Ryo Nakagawa2, Toshimaro Yoneda2, Takeshi Nakao2, Mamoru Ikeura2 (1.Tohoku Univ. NICHe, 2.Murata Manufacturing Co., Ltd.)
[23p-12H-11]Fabrication and Electrical Characterization of Ferroelectric Gate FETs for Physical Reservoir Computing
〇Yu Ukezeki1, Hiroto Yamada1, Norifumi Fujimura1, Tokuji Yokomatu2, Kensuke Kanda2, Kazusuke Maenaka2, Takeshi Yoshimura1 (1.Osaka Metro. Univ., 2.Univ. of Hyogo)