Presentation Information
[23p-1BL-7]Development of Photo-assisted Scanning Probe Microscopy and Its Application to Investigation of Solar Cell Materials
〇Takuji Takahashi1,2 (1.IIS, Univ. of Tokyo, 2.INQIE, Univ. of Tokyo)
Keywords:
scanning probe microscopy,solar cell
In this presentation, we will introduce photo-assisted Kelvin probe force microscopy that realizes photovoltaic measurements and photothermal-mode atomic force microscopy that enables us to investigate photo-induced thermal expansion by showing the examples of their application to the evaluation of microcrystalline Cu(In,Ga)(S,Se)2 solar cell materials.