Presentation Information

[24a-1BB-10]Dependence of SiC-silicon vacancy charge state stability on doping conditions

〇Yuichi Yamazaki1, Ryosuke Akashi1, Masafumi Hanawa2, Koichi Murata2, Shin-ichiro Sato1, Masanobu Miyawaki1, Shiro Entani1, Yuta Masuyama1, Yuichiro Matsushita1,3, Hidekazu Tsuchida2, Kohda Makoto1,4, Ohshima Takeshi1,4 (1.QST, 2.CRIEPI, 3.Tokyo Tech., 4.Tohoku Univ.)

Keywords:

Spin defect,SiC,Doping condition dependence

For a silicon vacancy (VSi) in silicon carbide (SiC), to function as a quantum sensor, its charge state must be negative monovalence (VSi-). Charge state stability in devices composed of epitaxial layers with various properties is important for direct observation applications inside SiC power devices. In this study, we report the results of a systematic investigation of VSi charge state stability by varying the doping conditions and VSi concentration over a wide range.