Presentation Information

[24p-12K-6]Dependence of electrical conduction properties on Ru composition in β-(Fe1-xRux)Si2 polycrystalline films

〇Yutaka Sakurai1, Takumi Takahashi1, Yoshikazu Terai1 (1.Kyushu Inst. of Tech.)

Keywords:

Silicide semiconductors,Mixed crystal,Electrical Conduction Mechanism

We have focused on Ru-doped β-FeSi2 to control the band structure of the silicide semiconductor β-FeSi2. We have succeeded in fabricating polycrystalline β-(Fe1-xRux)Si2 thin films up to x=0.71 by sputtering method, and have confirmed that the Ru-doping increases the 1.5 µm emission intensity. However, the effect of Ru-doping on the electrical conduction properties has not yet been verified. In this study, we evaluated the electrical conduction properties of β-(Fe1-xRux)Si2 polycrystalline thin films.