[24p-P11-1~2] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[24p-P11-1] Mechanism of electric conduction in SiO₂ films under X-ray irradiation

〇(M2)Shuhei Murata^1,2, Hiroshi Nohira¹, Daisuke Kobayashi², Kazuyuki Hirose² (1.Tokyo City Univ., 2.ISAS/JAXA.)

Keywords:

semiconductor,Mechanism of electric conduction

When an insulating thin film is irradiated with X-rays, charges are generated in the film and a current flows, but since the conduction mechanism is still not fully understood, we will focus on the steady state after X-ray irradiation.