[24p-P16-1~41] 21 Joint Session K "Wide bandgap oxide semiconductor materials and devices" (Poster)

[24p-P16-9] Characterization of SnS surface morphology depending on sulfurization pressure of Sn thin films

〇(M1)Daiki Watanabe¹, Kento Moriya¹, Shinya Aikawa¹ (1.Kogakuin Univ.)

Keywords:

SnS,Surface morphology,Thin film