Presentation Information

[25a-61A-2]Evaluation of ALD polycrystalline indium oxide films using O2 and H2O plasma

〇(M1)JONGHO PARK1, Sota Takahashi1, Takuya Hoshii1, Takanori Takahashi2, Misa Sunagawa3, Yuki Tsuruma3, Shigekazu Tomai3, Kazuo Tsutsui1, Hitoshi Wakabayashi1, Yukiharu Uraoka2, Kuniyuki Kakushima1 (1.Tokyo Tech, 2.NAIST, 3.Idemitsu Kosan Co., Ltd.)

Keywords:

Oxide Semiconductor