Presentation Information
[7a-P01-4]Fast fluorescence mode XAFS measurement using two-dimensional X-ray detector for dilute samples
〇Tomoya Uruga1,2, Takuma Kaneko1, Tomonao Inoue3, Takuto Sakumura3, Hideto Imai1,4, Yoshiharu Uchimoto1 (1.Kyoto Univ., 2.JASRI, 3.RIGAKU, 4.FC-Cubic)
Keywords:
XAFS,fluorescence mode XAFS,two-dimensional X-ray detector
X-ray absorption fine structure (XAFS) spectroscopy is a powerful method to obtain chemical state and local structure information of the target element in samples. We have been developing measurement systems that realizes fast fluorescence mode XAFS measurement on dilute samples. In this study, we will present the results of feasibility study of fast fluorescence mode XAFS measurement using the two-dimensional X-ray detector (XSPA-400ER, RIGAKU) as a fluorescence X-ray detector.