[7p-N104-1~8] Recent progress in atomic/nano-scale electronic states measurement using scanning probe microscopy

2:05 PM - 2:35 PM JST(5:05 AM - 5:35 AM UTC)

[7p-N104-3] Advances in Ultrafast Dynamics Measurements with Scanning Probe Microscopy

〇Shoji Yoshida¹ (1.Univ. of Tsukuba)

Keywords:

Scanning Probe Microscopy

Techniques for observing ultrafast phenomena in nanostructures with high spatial and temporal resolution have been rapidly advancing, particularly in time-resolved measurements using scanning probe microscopy combined with optical pump-probe methods. Among these, terahertz scanning tunneling microscopy (THz-STM) has emerged as a powerful tool that enables visualization of ultrafast dynamics while maintaining the atomic-scale spatial resolution inherent to STM. In this talk, we will present recent developments in THz-STM and introduce our work on exciton dynamics measurement and real-space imaging in a two-dimensional semiconductor.