The 86th JSAP Autumn Meeting 2025
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Session Details

Symposium (Oral)Symposium : Recent progress in atomic/nano-scale electronic states measurement using scanning probe microscopy

[7p-N104-1~8]Recent progress in atomic/nano-scale electronic states measurement using scanning probe microscopy

Sun. Sep 7, 2025 1:30 PM - 5:05 PM JST
Sun. Sep 7, 2025 4:30 AM - 8:05 AM UTC
N104 (Lecture Hall North)
1:30 PM - 1:35 PM JST(4:30 AM - 4:35 AM UTC)

[7p-N104-1]Opening

〇Takashi Ichii1 (1.Kyoto Univ.)
1:35 PM - 2:05 PM JST(4:35 AM - 5:05 AM UTC)

[7p-N104-2]Time-resolved scanning nonlinear dielectric microscopy for nanoscale characterization of semiconductor properties

〇Kohei Yamasue1 (1.Tohoku Univ.)
2:05 PM - 2:35 PM JST(5:05 AM - 5:35 AM UTC)

[7p-N104-3]Advances in Ultrafast Dynamics Measurements with Scanning Probe Microscopy

〇Shoji Yoshida1 (1.Univ. of Tsukuba)
2:35 PM - 3:05 PM JST(5:35 AM - 6:05 AM UTC)

[7p-N104-4]Recent Developments of Electrostatic Force Microscopy and Photo-induced Force Microscopy

〇Yasuhiro Sugawara1, Yanjun Li1 (1.Osaka Univ.)
3:20 PM - 3:50 PM JST(6:20 AM - 6:50 AM UTC)

[7p-N104-5]Excited state formation in a single molecule by terahertz-field-driven tunneling current

〇Kensuke Kimura1,2 (1.RIKEN SISL, 2.Univ. Tokyo)
3:50 PM - 4:05 PM JST(6:50 AM - 7:05 AM UTC)

[7p-N104-6]Wide frequency range measurement of scanning impedance microscopy using heterodyne method and its application to analysis of all-solid-state batteries

〇Yuji Yamagishi1, Hirotada Gamo1, Yasushi Maeda1, Zyun Siroma1, Tetsu Kiyobayashi1, Nobuhiko Takeichi1, Hikaru Sano1 (1.AIST)
4:05 PM - 4:35 PM JST(7:05 AM - 7:35 AM UTC)

[7p-N104-7]Local Electrical Characterization of Organic Thin-Film Transistors Using Time-Resolved Kelvin-probe Force Microscopy

〇Kei Kobayashi1 (1.Kyoto Univ.)
4:35 PM - 5:05 PM JST(7:35 AM - 8:05 AM UTC)

[7p-N104-8]Charge migration probed by electrostatic force microscopy

〇Takuya Matsumoto1 (1.Univ. Osaka)
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