[7p-N104-1~8] Recent progress in atomic/nano-scale electronic states measurement using scanning probe microscopy

4:05 PM - 4:35 PM JST(7:05 AM - 7:35 AM UTC)

[7p-N104-7] Local Electrical Characterization of Organic Thin-Film Transistors Using Time-Resolved Kelvin-probe Force Microscopy

〇Kei Kobayashi¹ (1.Kyoto Univ.)

Keywords:

atomic force microscopy,organic semiconductor,transistor

The presentaiton outlines the evaluation of carrier dynamics in organic thin-film transistors (OTFTs) using time-resolved electrostatic force microscopy (tr-EFM) and time-resolved Kelvin probe force microscopy (tr-KPFM), introducing various measurement schemes and application examples to local electrical characterization of OTFTs.