[7p-N104-1~8] Recent progress in atomic/nano-scale electronic states measurement using scanning probe microscopy

4:35 PM - 5:05 PM JST(7:35 AM - 8:05 AM UTC)

[7p-N104-8] Charge migration probed by electrostatic force microscopy

〇Takuya Matsumoto¹ (1.Univ. Osaka)

Keywords:

Time-resolved electrostatic force microscopy,Fowler-Nordheim spectroscopy,Charge mobility

Electrostatic force microscopy can measure surface charges of samples on insulator substrates, such as highly resistive samples and isolated charges, which cannot be measured by scanning tunneling microscopy, which requires a steady controlled current. This talk will focus on examples of observations of in-plane and perpendicular charge transfer, especially by using a probe-locked time-resolved electrostatic force microscope and the Fowler-Nordheim spectroscopy method.