Presentation Information
[7p-N301-5]Growth of orientation-controlled (100)-oriented rare-earth-doped epitaxial HfO2thin films
〇(M2)Yutaro Tsuchiya1, Yuxian Hu1, Kazuki Okamoto1, Wakiko Yamaoka2, Yasunaga Kagaya2, Yukari Inoue2, Hiroshi Funakubo1 (1.Science Tokyo, 2.TDK Corporation)
Keywords:
ferroelectric,HfO2,PLD
To experimentally determine the spontaneous polarization of HfO2, it is essential to fabricate films with the short axis containing the polarization direction oriented out-of-plane, i.e., (010)/(001) orientation. Our previous study demonstrated that aligning the in-plane long axis of the film with the underlying layer promotes out-of-plane alignment of the short axis. In this study, we attempted to control the crystal orientation using various lanthanide-doped HfO2 films, which are expected to exhibit different lattice parameters due to the variation in ionic radii of the dopants.
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