[7p-N302-1~19] 17.3 Layered materials

6:15 PM - 6:30 PM JST(9:15 AM - 9:30 AM UTC)Highlighted Presentation

[7p-N302-19] Crystallographic-orientation-resolved interlayer friction microscope

〇Yuta Seo¹, Nima Barri², Boran Kumral², Kenji Watanabe³, Takashi Taniguchi³, Tobin Filleter², Tomoki Machida¹ (1.IIS Univ. Tokyo, 2.Univ. Toronto, 3.NIMS)

Keywords:

two-dimensional material,scanning probe microscope

We developed a new method to evaluate the interlayer friction between two-dimensional materials with twist-angle modulation. We realized the method by using a special cantilever covered with a two-dimensional material. Using the cantilever in an atomic force microscope, we can evaluate the interlayer friction between the two-dimensional materials on the cantilever and on a substrate. In the presentation, we will discuss the twist-dependent interlayer friction between BN layers and between BN and graphene layers.