Presentation Information
[7p-N302-19]Crystallographic-orientation-resolved interlayer friction microscope
〇Yuta Seo1, Nima Barri2, Boran Kumral2, Kenji Watanabe3, Takashi Taniguchi3, Tobin Filleter2, Tomoki Machida1 (1.IIS Univ. Tokyo, 2.Univ. Toronto, 3.NIMS)
Keywords:
two-dimensional material,scanning probe microscope
We developed a new method to evaluate the interlayer friction between two-dimensional materials with twist-angle modulation. We realized the method by using a special cantilever covered with a two-dimensional material. Using the cantilever in an atomic force microscope, we can evaluate the interlayer friction between the two-dimensional materials on the cantilever and on a substrate. In the presentation, we will discuss the twist-dependent interlayer friction between BN layers and between BN and graphene layers.