Presentation Information
[9a-N305-10]Improved electron mobility of polycrystalline InGaAs thin films via solid-phase crystallization
〇(M1)Yutaka Kiyono1, Koki Nozawa1, Seo Jisol1, Takashi Suemasu1, Kaoru Toko1 (1.Univ. of Tsukuba)
Keywords:
semiconductor,crystal growth
In this study, we aimed to improve the carrier mobility of polycrystalline InGaAs thin films for thin-film transistor applications by applying solid-phase crystallization (SPC) under controlled deposition temperature (Td) and As composition ratio (RInGa/As). An amorphous precursor was obtained under low Td and RInGa/As conditions, and subsequent high-temperature SPC promoted crystallization, resulting in an electron mobility (μn) of up to 830 cm2 V-1 s-1. These results demonstrate that optimizing the precursor state and annealing conditions is crucial for enhancing μn.