Presentation Information

[9a-S203-8]Process Flow Optimization for GAAFET Using Profile Simulator

〇Yoko Tanaka1, Kenzo Manabe1, Atsushi Yagishita1, Masanaga Fukasawa1, Toshifumi Irisawa1, Yoshihiro Hayashi1 (1.AIST SFRC)

Keywords:

semiconductor,GAAFET,profile simulator

The Gate-All-Around MOSFET (GAAFET) has complex shapes and is constructed from a variety of material layers, leading to numerous trade-offs during the GAAFET process. We focus on a critical trade-off between the protection of the Dummy Gate and the lowering of Fin side-wall spacer height, and we optimize the conditions using a profile simulator. We also present the results obtained by applying the optimized conditions to the actual GAAFET process.