Session Details

[9a-S203-1~10]13.5 Semiconductor devices/ Interconnect/ Integration technologies

Tue. Sep 9, 2025 9:00 AM - 11:45 AM JST
Tue. Sep 9, 2025 12:00 AM - 2:45 AM UTC
S203 (Lecture Hall South)

[9a-S203-1][The 58th Young Scientist Presentation Award Speech] Improvement of crystal quality by selective H2-introduced molecular beam epitaxy and room temperature operation of GeSn/GeSiSn resonant tunneling diode

〇Shota Torimoto1, Shuto Ishimoto1, Yoshiki Kato1, Mitsuo Sakashita1, Masashi Kurosawa1, Osamu Nakatsuka1,2, Shigehisa Shibayama1 (1.Grad. Sch. of Eng., Nagoya Univ., 2.IMaSS, Nagoya Univ.)

[9a-S203-2]Understanding the interfacial reaction of Bi2Te3/n-Ge and the effects on contact properties

〇(M1C)Mitsutaka Itoo1, Mihyeon Kim1, Shogo Hatayama2, Wen Hsin Chang2, Yuta Saito1,2,3 (1.Tohoku Univ., 2.SFRC, AIST, 3.GXT, Tohoku Univ.)

[9a-S203-3]Nanosheet Oxide Semiconductor FETs with Amorphous and Polycrystalline InGaOx

〇(DC)Kota Sakai1, Sunbin Hwang2, Anlan Chen1, Ki-woong Park1, Xingyu Huang1, Takuya Saraya1, Toshiro Hiramoto1, Takanori Takahashi3, Mutsunori Uenuma2, Yukiharu Uraoka3, Masaharu Kobayashi1 (1.IIS, The Univ. Tokyo, 2.AIST, 3.NAIST)

[9a-S203-4]Gate-All-Around Nanosheet Oxide Semiconductor FETs with Selectively Crystallized InGaOx

〇(DC)Kota Sakai1, Anlan Chen1, Ki-woong Park1, Xingyu Huang1, Takuya Saraya1, Toshiro Hiramoto1, Sunbin Hwang2, Takanori Takahashi3, Mutsunori Uenuma2, Yukiharu Uraoka3, Masaharu Kobayashi1 (1.IIS, The Univ. Tokyo, 2.AIST, 3.NAIST)

[9a-S203-5]Spectroscopic ellipsometry characterization of SiP film for nano-sheet FET process

〇Naoto Kumagai1, Toshifumi Irisawa1, Yoshihiro Hayashi1 (1.SFRC, AIST)

[9a-S203-6]Formation of Work Function Metals for Advanced Gate-all-around CMOS FET

〇Kenzo Manabe1, Misako Morota1, Hiroyuki Ota1, Yukinori Morita1, Toshifumi Irisawa1, Yoshihiro Hayashi1 (1.SFRC, AIS)

[9a-S203-7]Device Design of Nanosheet GAAFETs using Response Surface Method

〇Koichi Fukuda1, Mariko Ninomiya1, Junichi Hattori1, Yoshihiro Hayashi1 (1.AIST)

[9a-S203-8]Process Flow Optimization for GAAFET Using Profile Simulator

〇Yoko Tanaka1, Kenzo Manabe1, Atsushi Yagishita1, Masanaga Fukasawa1, Toshifumi Irisawa1, Yoshihiro Hayashi1 (1.AIST SFRC)

[9a-S203-9]Demonstration of Integrate-and-Fire Operation using “GCCI SOI-Tr” with Gate Input Method

〇Haruki Yonezaki1,2, Takayuki Mori1, Jiro Ida1 (1.Kanazawa Inst. of Tech., 2.KIOXIA Corp.)

[9a-S203-10]Structural Effects on Program Characteristics in 3D Flash Memories with Gate Side Injection Operation

〇Tatsuya Ishikawa1, Hiroshi Takeda1, Takashi Kurusu1 (1.KIOXIA Corporation)