Presentation Information

[9p-N301-2]Tilt-scan DPC-STEM Analysis of Polarity-Inverted AlN Crystals

〇Shigetaka Tomiya1, Zentaro Akase1, Kazunori Iwamitsu1, Akira Yasuhara2, Tomohiro Tamano3, Ryota Akaike3, Hideo Miyake3 (1.NAIST, 2.JEOL, 3.Mie Univ.)

Keywords:

Differential Phase Contrast,Polarity inverted aluminum nitride crystal

DPC-STEM enables visualization of electric field distributions; however, in crystalline specimens, diffraction contrast often hinders accurate analysis. In this study, by applying the Tilt-scan DPC method, the electric field distribution near the polarity inversion interface in AlN was obtained with high contrast and clarity.

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