[9p-N302-1~6] 15.7 Crystal characterization, impurities and crystal defects

1:30 PM - 1:45 PM JST(4:30 AM - 4:45 AM UTC)

[9p-N302-1] Installation of a High-Throughput X-ray Topography System at SPring-8 BL16B2

〇Takayoshi Shimura^1,4, Kajiwara Kentaro², Takashi Kameshima^2,4, Satoshi Yamaguchi³, Taito Osaka⁴, Makina Yabashi⁴ (1.Waseda Univ., 2.JASRI, 3.Toyota Central Labs., 4.RIKEN)

Keywords:

X-ray topography,dislocation,imaging

X-ray topography is a non-destructive technique that enables visualization of the real-space distribution of crystal defects within single crystals. It has been utilized for many years in the evaluation of single crystal growth processes and in various application fields involving single crystals. We have designed and developed an X-ray topography system capable of wide-field and high spatial resolution measurements, which has been installed at SPring-8 BL16B2. In this presentation, we report on the specifications of the system and initial measurement results.