Session Details
[9a-N307-1~11]CS.10 Code-sharing session of 6.6 &12.2
Tue. Sep 9, 2025 9:00 AM - 12:00 PM JST
Tue. Sep 9, 2025 12:00 AM - 3:00 AM UTC
Tue. Sep 9, 2025 12:00 AM - 3:00 AM UTC
N307 (Lecture Hall North)
[9a-N307-1]Influence of atomic hydrogen on the structure formed by hexabromotriphenylene on a Cu(111) surface
〇Tomoya Katsurayama1, Hiroyuki Sakaue1, Yukihiro Tominari2,3, Syukichi Tanaka2, Hitoshi Suzuki1 (1.Hiroshima Univ., 2.NICT, 3.AIST G-QuAT)
[9a-N307-2]Control of Molecular Motion using Photons
〇Ken Motonaga1, Lukas Gerhard2, Wulf Wulfhekel2, Masaki Horie3, Toyo Kazu Yamada1 (1.Chiba Univ., 2.KIT, 3.Hokkaidou Univ)
[9a-N307-3]Electronic Structure of Superatom Molecular Orbitals of Li+@C70-CPP Supramolecules
〇(M2)Yuki Kono1, Yuki Munezawa1, Ryohei Tsuruta1, Hiroshi Ueno2, Yoichi Yamada1 (1.Univ. Tsukuba, 2.Tohoku Univ.)
[9a-N307-4]Molecular orientation analysis of pentacene thin film on reduced rutile TiO2(110)
〇(M2)Rintaro Hori1, Yuri Hasegawa2, Naoyuki Maejima1, Masaru Takizawa1 (1.Ritsumeikan Univ., 2.Univ. of Tsukuba)
[9a-N307-5]Impact of Molecule–Electrode Interaction on Quantum Interference Effect in Molecular Junctions
〇Shintaro Fujii1, Aoshi Yamane1, Haruki Goto1, Tomoaki Nishino1 (1.Science Tokyo)
[9a-N307-6]Structure Identification of CO Monolayer on Ag(111) Using AFM
Mitsuo Kimura1, Yuji Kunisada2, 〇Yoshiaki Sugimoto1 (1.Univ. Tokyo, 2.Hokkaido Univ.)
[9a-N307-7]Time-resolved tracking of surface potential at the g-C3N4/MoS2 heterojunction interface using Kelvin probe force microscopy
〇Yuto Suzuki1, Kei Noda1 (1.Keio Univ.)
[9a-N307-8]Triboelectric charging phenomena in fluorine-containing monolayer
〇Masahiro Nakayama1, Naoya Mishima1, Tomoki Misaka1, Takashi Yamada1, Hiroshi Ohoyama1, Takuya Matsumoto1 (1.University of Osaka)
[9a-N307-9]PDMS ultrathin film formed on HOPG observed by FM-AFM
〇Hiroaki Ooe1, Toyoko Arai2 (1.Yokohama City Univ., 2.Kanazawa Univ.)
[9a-N307-10]In-situ Observation of Corrosion Behavior of Metallic Materials
〇Yuya Takara1, Takahiro Ozawa1 (1.KOBE STEEL)
[9a-N307-11]Sub-nanoscale structural analysis of corrosion protection film for copper fine wires on semiconducting devices by in-liquid AFM
〇Daiki Oka1, Hayashi Kaito1, Miyata Kazuki1, Uno Megumi2, Takatoh Chikako2, Fukuma Takeshi1 (1.Kanazawa Univ., 2.EBARA Corp.)