Presentation Information
[14a-K507-6]Cooperative oxidation reaction at dangling bond sites of Si(001) surface and interface
〇Yuki Okabe1, Yasutaka Tsuda2, Hengyu Wen1, Akitaka Yoshigoe2, Yuji Takakuwa2,3, Shuichi Ogawa1 (1.Nihon Univ., 2.JAEA, 3.Tohoku Univ.)
Keywords:
Si thermal oxidation,real time XPS,surface reaction
In this study, we observe the Si(001) surface oxidation process in real time by XPS to clarify the competing oxidation reaction pathways at the dimer and vacancy: ins/ins and tri/ad in Loop A and tri/tri and tri/ad pairs in Loop B are observed to occur by O2 dissociative adsorption, and the oxygen adsorption orientations O2 adsorption orientation also distinguishes Loop A from Loop B.
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