Presentation Information
[14a-P01-36]Study on the internal structure of organic semiconductor radiation sensor using image processing
〇Zhaobo Wang1, Eri Miyata1, Erika Fukasawa2, Hitoshi Miyata3, Kiyoshi Hayasaka3,4, Masaaki Katsumata5, Hiroaki Ono6, Minori Watanabe6, Eisuke Saito7, Yoshiaki Seino8, Akinori Umeyama9, Makoto Sato9, Takahito Suzuki9, Masaaki Tamura9 (1.Ashikaga Univ., 2.NIT,Gunma Col., 3.Niigata Univ., 4.KEK, 5.Kanagawa P.H., 6.Nippon Dental Univ., 7.NIT,Nagano Col., 8.NIT,Toyama Col., 9.Japan Carlit Co. Ltd.)
Keywords:
organic semiconductor,radiation detector,image processing
Inorganic semiconductor radiation detectors have problems such as limited design flexibility and high cost. To solve these problems, we developed an organic semiconductor radiation sensor by combining an n-type titanium oxide (TiO2) semiconductor as an additive with a p-type polyaniline (PANI) semiconductor. The sensor is expected to achieve high detection efficiency because of the efficient creation of electron-hole pairs due to the presence of a wide junction interface. In this study, we report on the internal structure and detection efficiency of the sensor due to the different mixing methods in fabrication.
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