Presentation Information
[14p-K305-6]Anomalous X-ray transmission occurring at interface of crystal stacking faults
〇yoshiki kohmura1, kei sawada1, hidekazu takano1, tetsuya ishikawa1 (1.RIKEN)
Keywords:
stacking fault defect,anomalous transmission,band topology
As an example of "band topology" focusing on edges in a periodic medium, microwaves were irradiated onto a multilayer film sample containing non-periodic layers, and a transmittance of approximately 100% was measured in the reflected frequency band. We were the first in the world to observe the phenomenon of anomalous X-ray transmission, which shows a transmittance of approximately 200% near the interface of stacking faults in a crystal where the periodicity is broken, and showed that the high transmittance is the result of X-rays being concentrated by the "X-ray translation effect" in the direction from the crystal region away from the stacking fault toward the interface.
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