Presentation Information

[14p-K502-8]Initial study of a novel real-time dosimetry system using spherical small Si semiconductor devices - Evaluation with computed tomography -

〇(D)Masaki Fujisawa1, Yohei Inaba1,2, Ryota Shindo1, Takumi Matsumoto3, Shinnosuke Matsumoto4, Wataru Kada3, Koichi Chida1,2 (1.Med., Tohoku Univ, 2.Dis., Tohoku Univ, 3.Eng., Tohoku Univ, 4.Tokyo Metropolitan Univ)

Keywords:

radiation measurement,semiconductor,CT

In CT perfusion and 4D-CT imaging, patients are exposed to high radiation doses, making precise dose monitoring essential. In this study, we evaluated the application of a newly developed real-time dose measurement system that utilizes a compact spherical silicon (Si) semiconductor device in CT examinations. As part of the fundamental assessment, we examined the energy dependence, dose dependence, and dose rate dependence during CT fluoroscopy. While the system's response declined at higher tube voltages (indicating higher energy levels), the dose dependence and dose rate dependence exhibited trends consistent with those observed in a reference dosimeter.

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