[14p-K507-1~17] CS.5 Code-sharing Session of 6.5 & 7.5

3:45 PM - 4:00 PM JST(6:45 AM - 7:00 AM UTC)

[14p-K507-10] Structural Identification and Analysis of the Alignments of Oxygen Vacancies on Titanium Dioxide Surfaces
-Analysis Through Improved Recognition Methods -

Sota Tsubokura^1,2, Shoya Kawano³, Yumiko Imai⁴, Tadashi Ueda⁴, Kei-ichi Nakamoto⁴, Haruo Noma^1,2, Hirohisa Hioki¹, 〇Taketoshi Minato⁴ (1.Graduate School of Human and Environmental Studies, Kyoto Univ., 2.College of Information Science and Engineering, Ritsumeikan Univ., 3.Kyushu Inst. Tech., 4.IMS)

Keywords:

Image Processing,Oxygen Vacancies,Scanning Probe Microscopy

Scanning probe microscopy (SPM) is an excellent technique for analyzing structural, electrical, electronic, and magnetic properties at the nanoscale and atomic scale, providing high-resolution imaging data. Traditional SPM image analysis methods, such as Fourier transform and autocorrelation analysis, are widely used but face challenges in analyzing local interactions within non-periodic or complex structures. In this presentation, we introduce a newly developed method that utilizes a portion of an SPM image as a template to perform localized analyses of differences with the data image. This approach enables the identification of specific local structures and the elucidation of local interactions.