Presentation Information
[14p-P07-16]Development of an Experimental Training Program from Lower Grade KOSEN Students to Promote Interest in the Semiconductor Fields by Utilizing Scanning Electron Microscopy (SEM)
〇Risako Taguchi1, Shigetaka Katori1 (1.National Institute of Technology, Tsuyama College)
Keywords:
semiconductor,Scanning Electron Microscopy
The importance of semiconductor education at National Institute of Technology (NIT), is increasing. At NIT Tsuyama college, we conducted practical training for first-year and third-year students to understand the principles of scanning electron microscopy (SEM) and master observation techniques. The first-year students learned basic operations, while the third-year students set up observation conditions and performed elemental analysis. In this practical training program, students can learn from the basics to the applications, and acquire skills that will enable them to be immediately effective in the semiconductor field. The students who received practical training were satisfied with the contents of the program, and the effectiveness of the program was confirmed.
Comment
To browse or post comments, you must log in.Log in