Presentation Information

[14p-P10-25]Die-Level 3D-IC Fabrication Technology for 3D Heterogeneous Chiplet Integration

〇(D)Jiayi Shen1, Chang Liu1, Tetsu Tanaka1,2, Takafumi Fukushima1,2 (1.Graduate School of Engineering, Tohoku Univ., 2.Graduate School of Biomedical Engineering, Tohoku Univ.)
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Keywords:

Die-level process,3D-IC/TSV,Chiplets

This paper presents a cost-effective die-level TSV process for rapid prototyping of 3D-ICs from commercially available 2D-ICs called shuttle dies that are manufactured in foundry services. The 3D integration process employs advanced via-last TSV formation with temporary bonding/debonding and magnetron sputtering for high-aspect-ratio barrier/seed metal deposition without long-through ionized PVD. In this work, we successfully demonstrate heterogeneous 3D integration of a micro-LED array that is stacked on a 40-um-thin 3D-IC with Cu-TSVs.

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