Presentation Information
[15a-K301-7]Modulation of Schottky Barrier in WSe2 FET through Insulating Polymer Layer Insertion
〇(M1)Ryoichiro Naoi1, Durgadevi Elamaran1, Daisuke Kiriya1 (1.The Univ. of Tokyo)
Keywords:
MOSFET
The Schottky barrier formed at the metal-semiconductor interface is expected to exhibit a barrier height that varies depending on the type of metal. However, in two-dimensional semiconductors, it is well-known that Fermi level pinning (FLP) occurs, resulting in a constant barrier height regardless of the metal used. In this study, we report on the potential modulation of the Schottky barrier in WSe2 field-effect transistors by inserting an insulating polymer layer directly beneath the electrodes to mitigate FLP.
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