Presentation Information

[15a-K303-6]Epitaxial growth of Mn4−xPdxN films and evaluation of their magnetic properties

〇(B)Soushi Akita1, Tomohiro Yasuda1, Kenta Amemiya2, Takashi Suemasu1 (1.Tsukuba Univ., 2.KEK)

Keywords:

nitride,ferrimagnetic,spintronics

Epitaxial Mn4-xPdxN thin films (x = 0.00–0.50) with a thickness of approximately 25 nm were fabricated on SrTiO3(001) substrates using molecular beam epitaxy. The crystallinity, magnetic properties, and magnetic structure were evaluated at room temperature. ω–2θ XRD and RHEED measurements confirmed successful epitaxial growth for all compositions. The composition dependence of the saturation magnetization and anomalous Hall angle indicated that the magnetic compensation composition lies in the range of 0.1 ≤ x ≤ 0.15. Furthermore, X-ray magnetic circular dichroism (XMCD) analysis suggested that Pd doping induces non-collinear magnetism, leading to changes in the magnetic structure.

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