[15a-K404-1~12] 12.2 Characterization and Materials Physics

9:45 AM - 10:00 AM JST(12:45 AM - 1:00 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[15a-K404-4] Attempts of Photoelectron Yield Spectroscopy Measurement Using Surface Potential Measurement of Insulators

〇(M1)Hideichiro Kamimura¹, Masahiro Ohara^1,4, Runa Hoshikawa¹, Hisao Ishii^1,2,3 (1.GSSE, Chiba Univ., 2.CFS, Chiba Univ., 3.MCRC, Chiba Univ., 4.F.Eng. Shinshu Univ.)

Keywords:

Photoelectron yield spectroscopy,Kelvin probe method,Insulator

Photoelectron yield spectroscopy (PYS) is a widely used method to determine ionization energies of various organic electronic materials, but existing methods have problems in environmental dependence and sensitivity. In this study, in order to achieve PYS with high sensitivity and compatibility with insulators under vacuum and atmospheric conditions, we fabricated a system that enables real-time measurement of surface potential changes using a rotating Kelvin probe (RKP) while sweeping the wavelength of irradiating light, and verified its effectiveness by using TPBi thin films and other materials.