[15a-K404-1~12] 12.2 Characterization and Materials Physics

10:45 AM - 11:00 AM JST(1:45 AM - 2:00 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[15a-K404-7] Thermal Conversion Mechanisms in Benzoporphyrin Precursor Thin Film Revealed by Nanostructural Analysis with AFM-IR

〇(DC)Takayuki Oka¹, Nobutaka Shioya¹, So Ueno¹, Mitsuaki Yamauchi¹, Hiroko Yamada¹, Takeshi Hasegawa¹ (1.ICR, Kyoto Univ.)

Keywords:

AFM-IR,Atomic force microscopy,Infrared specroscopy

Benzoporphyrins (BP) are excellent organic semiconductor materials, and BP thin films are formed from precursor thin films through thermal conversion reactions. Although many previous studies have already investigated the reaction processes of the precursor materials of BP, few focuses on the structural distribution within the thin films. In this study, the distribution of reaction intermediates has been investigated by AFM-IR, which measures infrared (IR) spectra in microscopic regions of atomic force microscope (AFM) images. As a result, the structural distribution of complex thin films containing intermediates are revealed at the nanoscale for the first time.